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Vitreous and porcelain enamels — Low-voltage test for detecting and locating defects — Part 1: Swab test for non-profiled surfaces
Method A (electrical) is applicable to the rapid detection and determination of the general location of defects. Method B (optical), based on colour effects, is applicable to the more precise detection of defects and their exact locations. Both methods are commonly applied to flat surfaces. For more intricate shapes, such as undulated and/or corrugated surfaces, ISO 8289-2 is applicable.
NOTE 1 Selection of the correct test method is critical to distinguish the areas of increased conductivity detected by method B from actual pores that extend to the basis metal, which can be detected by both methods.
NOTE 2 The low voltage test is a non-destructive method of detecting defects and, therefore, is completely different from the high voltage test specified in ISO 2746. The results of the high and low voltage tests are not comparable and will differ.
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