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JIS H 0609:1999

Test methods of crystalline defects in silicon by preferential etch techniques

General Information

Status : ACTIVE
Standard Type: Main
Document No: JIS H 0609:1999
Document Year: 1999
  • Section Volume:
  • H Non-ferrous Metals and Metallurgy
  • ICS:
  • 31.200 Integrated circuits. Microelectronics
  • 77.120.99 Other non-ferrous metals and their alloys

Life Cycle

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ACTIVE
JIS H 0609:1999
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