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ISO 16243:2011

Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

Standard Details

ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.

General Information

Status : Published
Standard Type: Main
Document No: ISO 16243:2011
Document Year: 2011
Pages: 9
Edition: 1

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ISO 16243:2011
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