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ISO

ISO 14975:2000

Surface chemical analysis — Information formats

Standard Details

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion

and revision of a surface chemical analysis spectral database. The format is applied to Auger electron

spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.

General Information

Status : Published
Standard Type: Main
Document No: ISO 14975:2000
Document Year: 2000
Pages: 17
Edition: 1

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ISO 14975:2000
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