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ISO 18116:2005

Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis

Standard Details

ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.

General Information

Status : Published
Standard Type: Main
Document No: ISO 18116:2005
Document Year: 2005
Pages: 16
Edition: 1

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ISO 18116:2005
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