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ISO/TS 25138:2010

Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry

Standard Details

ISO/TS 25138:2010 describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films.

The method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn and Al. Other elements that can be determined by the method are O, C, N, H, P and S.

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: ISO/TS 25138:2010
Document Year: 2010
Pages: 36
Edition: 1

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ISO/TS 25138:2010
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