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IEC 60759:1983 (EN-FR)

Standard test procedures for semiconductor X-ray energy spectrometers

Standard Details

Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60759:1983 (EN-FR)
Document Year: 1983
Pages: 97
Edition: 1.0
  • Section Volume:
  • TC 45 Nuclear instrumentation
  • ICS:
  • 17.240 Radiation measurements

Life Cycle

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ACTIVE
IEC 60759:1983 (EN-FR)
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