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Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
1.1 This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.
1.2 The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).
1.3 The minimum sample resistance required for an event detection in this standard is 10 Ω.
1.4 An ASTM guide for measuring electrical contact transients of various durations is available as Guide B854.
1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to become familiar with all hazards including those identified in the appropriate Material Safety Data Sheet (MSDS) for this product/material as provided by the manufacturer, to establish appropriate safety, health, and environmental practices, and determine the applicability of regulatory limitations prior to use.
1.7 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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