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IEC

IEC 62525:2007

Standard Test Interface Language (STIL) for Digital Test Vector Data

Standard Details

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62525:2007
Document Year: 2007
Pages: 143
Edition: 1.0
  • Section Volume:
  • TC 91 Electronics assembly technology
  • ICS:
  • 19.080 Electrical and electronic testing
  • 25.040.01 Industrial automation systems in general

Life Cycle

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ACTIVE
IEC 62525:2007
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