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ASTM E431 : 96

Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

Standard Details

1.1 This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

Status : Historical
Standard Type: Main
Document No: ASTM E431 : 96
Document Year: 1996
Pages: 7
  • Section Volume:
  • 03.03 Volume 03.03 Nondestructive Testing (E94 – E2373)

Life Cycle

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ASTM E431 : 96
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