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ASTM F1192 : 24

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

Standard Details

1.1 This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irra

General Information

Status : ACTIVE
Standard Type: Main
Document No: ASTM F1192 : 24
Document Year: 2024
Pages: 12
  • Section Volume:
  • 12.02 Volume 12.02 Nuclear (II), Solar, and Geothermal Energy; Radiation Processing
  • ICS:
  • 31.080.01 Semiconductor devices in general

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ASTM F1192 : 24

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