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BS EN 62374:2007

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

General Information

Status : Under Review
Standard Type: Main
Document No: BS EN 62374:2007
Document Year: 2007
Pages: 24
  • Section Volume:
  • GBM21 Electronic Components & Devices (GMB21)

Life Cycle

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Under Review
BS EN 62374:2007
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