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IEC

IEC 62374:2007 (EN-FR)

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Standard Details

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62374:2007 (EN-FR)
Document Year: 2007
Pages: 43
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices

Life Cycle

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ACTIVE
IEC 62374:2007 (EN-FR)
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