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IEC 62969-4:2018 (EN-FR)

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

Standard Details

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62969-4:2018 (EN-FR)
Document Year: 2018
Pages: 39
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices

Life Cycle

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ACTIVE
IEC 62969-4:2018 (EN-FR)
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