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IEC TR 63133:2017

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

Standard Details

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC TR 63133:2017
Document Year: 2017
Pages: 17
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC TR 63133:2017
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