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IEC 62374-1:2010 (EN-FR)

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Standard Details

IEC 62374-1:2010 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62374-1:2010 (EN-FR)
Document Year: 2010
Pages: 32
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices

Life Cycle

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IEC 62374-1:2010 (EN-FR)
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