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IEC 62047-40:2021

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

Standard Details

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62047-40:2021
Document Year: 2021
Pages: 11
Edition: 1.0

Life Cycle

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IEC 62047-40:2021
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