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IEC 60749-6:2002

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Standard Details

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.The contents of the corrigendum of August 2003 have been included in this copy.

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: IEC 60749-6:2002
Document Year: 2002
Pages: 7
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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WITHDRAWN
IEC 60749-6:2002
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