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IEC 60749-5:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Standard Details

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: IEC 60749-5:2003
Document Year: 2003
Pages: 13
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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WITHDRAWN
IEC 60749-5:2003
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