logo

Standards Manage Your Business

We Manage Your Standards

IEC

IEC 60749-4:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Standard Details

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.The contents of the corrigendum of August 2003 have been included in this copy.

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: IEC 60749-4:2002
Document Year: 2002
Pages: 15
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

Currently Viewing

WITHDRAWN
IEC 60749-4:2002
Knowledge Corner

Expand Your Knowledge and Unlock Your Learning Potential - Your One-Stop Source for Information!

© Copyright 2024 BSB Edge Private Limited.

Enquire now +