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IEC 60749-36:2003 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Standard Details

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60749-36:2003 (EN-FR)
Document Year: 2003
Pages: 7
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC 60749-36:2003 (EN-FR)
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