logo

Standards Manage Your Business

We Manage Your Standards

IEC

IEC 60749-32:2002 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

Standard Details

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. The contents of the corrigendum of August 2003 have been included in this copy.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60749-32:2002 (EN-FR)
Document Year: 2002
Pages: 9
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

Currently Viewing

ACTIVE
IEC 60749-32:2002 (EN-FR)
Knowledge Corner

Expand Your Knowledge and Unlock Your Learning Potential - Your One-Stop Source for Information!

© Copyright 2024 BSB Edge Private Limited.

Enquire now +