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IEC 60749-29:2011 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Standard Details

IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
- a number of minor technical changes;
- the addition of two new annexes covering the testing of special pins and temperature calculations.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60749-29:2011 (EN-FR)
Document Year: 2011
Pages: 48
Edition: 2.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC 60749-29:2011 (EN-FR)
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