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IEC 60749-23:2004 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Standard Details

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60749-23:2004 (EN-FR)
Document Year: 2004
Pages: 17
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC 60749-23:2004 (EN-FR)
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