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IEC 60749-2:2002 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

Standard Details

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.The contents of the corrigendum of August 2003 have been included in this copy.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60749-2:2002 (EN-FR)
Document Year: 2002
Pages: 11
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC 60749-2:2002 (EN-FR)
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