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IEC 60749-17:2019 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Standard Details

IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60749-17:2019 (EN-FR)
Document Year: 2019
Pages: 17
Edition: 2.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC 60749-17:2019 (EN-FR)
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