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IEC 60749-13:2018 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Standard Details

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60749-13:2018 (EN-FR)
Document Year: 2018
Pages: 28
Edition: 2.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC 60749-13:2018 (EN-FR)
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