logo

Standards Manage Your Business

We Manage Your Standards

IEC

IEC 60749-12:2017 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Standard Details

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60749-12:2017 (EN-FR)
Document Year: 2017
Pages: 14
Edition: 2.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

Currently Viewing

ACTIVE
IEC 60749-12:2017 (EN-FR)
Knowledge Corner

Expand Your Knowledge and Unlock Your Learning Potential - Your One-Stop Source for Information!

© Copyright 2024 BSB Edge Private Limited.

Enquire now +