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IEC 60749-1:2002 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Standard Details

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.The contents of the corrigendum of August 2003 have been included in this copy.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60749-1:2002 (EN-FR)
Document Year: 2002
Pages: 15
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC 60749-1:2002 (EN-FR)
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