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BS EN 60749-29:2003

Semiconductor devices. Mechanical and climatic test methods - Latch-up test

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: BS EN 60749-29:2003
Document Year: 2003
Pages: 24
  • Section Volume:
  • GBM21 Electronic Components & Devices (GMB21)
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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WITHDRAWN
BS EN 60749-29:2003
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