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BS EN 60749-19:2003+A1:2010

Semiconductor devices. Mechanical and climatic test methods - Die shear strength

General Information

Status : Definitive
Standard Type: Main
Document No: BS EN 60749-19:2003+A1:2010
Document Year: 2003
Pages: 10
  • Section Volume:
  • GBM21 Electronic Components & Devices (GMB21)
  • ICS:
  • 31.080.01 Semiconductor devices in general

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Definitive
BS EN 60749-19:2003+A1:2010
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