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IEC 62416:2010 (EN-FR)

Semiconductor devices - Hot carrier test on MOS transistors

Standard Details

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62416:2010 (EN-FR)
Document Year: 2010
Pages: 20
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices

Life Cycle

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ACTIVE
IEC 62416:2010 (EN-FR)
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