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IEC 63287-2:2023 (EN-FR)

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Standard Details

IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 63287-2:2023 (EN-FR)
Document Year: 2023
Pages: 30
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC 63287-2:2023 (EN-FR)
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