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IEC 62951-8:2023

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

Standard Details

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62951-8:2023
Document Year: 2023
Pages: 14
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices

Life Cycle

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ACTIVE
IEC 62951-8:2023
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