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IEC 62373-1:2020 (EN-FR)

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

Standard Details

IEC 62373-1:2020 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).
This document also defines the terms pertaining to the conventional BTI test method.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62373-1:2020 (EN-FR)
Document Year: 2020
Pages: 44
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices

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IEC 62373-1:2020 (EN-FR)
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