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BS IEC 62373-1:2020

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Fast BTI test for MOSFET

General Information

Status : Definitive
Standard Type: Main
Document No: BS IEC 62373-1:2020
Document Year: 2020
Pages: 26
  • Section Volume:
  • GBM21 Electronic Components & Devices (GMB21)

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Definitive
BS IEC 62373-1:2020
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