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IEC 61164:2004 (EN-FR)

Reliability growth - Statistical test and estimation methods

Standard Details

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.

This publication is to be read in conjunction with IEC 61014:2003.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 61164:2004 (EN-FR)
Document Year: 2004
Pages: 111
Edition: 2.0
  • Section Volume:
  • TC 56 Dependability

Life Cycle

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ACTIVE
IEC 61164:2004 (EN-FR)
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