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IEC 62899-503-1:2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

Standard Details

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62899-503-1:2020
Document Year: 2020
Pages: 15
Edition: 1.0
  • Section Volume:
  • TC 119 Printed Electronics

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IEC 62899-503-1:2020
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