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IEC 63202-1:2019 (EN-FR)

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells

Standard Details

IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 63202-1:2019 (EN-FR)
Document Year: 2019
Pages: 17
Edition: 1.0
  • Section Volume:
  • TC 82 Solar photovoltaic energy systems
  • ICS:
  • 27.160 Solar energy engineering

Life Cycle

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IEC 63202-1:2019 (EN-FR)
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