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ISO 17901-2:2015

Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics

Standard Details

ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.

General Information

Status : Published
Standard Type: Main
Document No: ISO 17901-2:2015
Document Year: 2015
Pages: 20
Edition: 1
  • ICS:
  • 31.020 Electronic components in general

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ISO 17901-2:2015
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