ISO/TS 11888:2017

Nanotechnologies — Characterization of multiwall carbon nanotubes — Mesoscopic shape factors

Standard Details

ISO/TS 11888:2017 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM), transmission electron microscopy (TEM), viscometry, and light scattering analysis.

ISO/TS 11888:2017 also includes additional terms needed to define the characterization of static bending persistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generally varies from several tens of nanometres to several hundred micrometres.

Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

General Information

Status : Published

Standard Type: Main

Document No: ISO/TS 11888:2017

Document Year: 2017

Pages: 18

Edition: 2

Section Volume:
ISO/TC 229. Nanotechnologies

ICS:
07.120 Nanotechnologies

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