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ISO 6342:1993

Micrographics — Aperture cards — Method of measuring thickness of buildup area

Standard Details

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: ISO 6342:1993
Document Year: 1993
Pages: 3
Edition: 1
  • ICS:
  • 37.080 Document imaging applications

Life Cycle

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WITHDRAWN
ISO 6342:1993
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