logo

Standards Manage Your Business

We Manage Your Standards

ISO

ISO 22493:2008

Microbeam analysis — Scanning electron microscopy — Vocabulary

Standard Details

ISO 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

The vocabulary is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of the vocabulary are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: ISO 22493:2008
Document Year: 2008
Pages: 22
Edition: 1

Life Cycle

Published

Currently Viewing

WITHDRAWN
ISO 22493:2008
Knowledge Corner

Expand Your Knowledge and Unlock Your Learning Potential - Your One-Stop Source for Information!

© Copyright 2024 BSB Edge Private Limited.

Enquire now +