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IEC 60444-2:1980 (EN-FR)

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Standard Details

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 60444-2:1980 (EN-FR)
Document Year: 1980
Pages: 18
Edition: 1.0
  • Section Volume:
  • TC 49 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
  • ICS:
  • 31.140 Piezoelectric devices

Life Cycle

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ACTIVE
IEC 60444-2:1980 (EN-FR)
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