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IEC

IEC TS 61945:2000 (EN-FR)

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

Standard Details

Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC TS 61945:2000 (EN-FR)
Document Year: 2000
Pages: 23
Edition: 1.0
  • ICS:
  • 31.200 Integrated circuits. Microelectronics

Life Cycle

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ACTIVE
IEC TS 61945:2000 (EN-FR)
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