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IEC 61967-6:2002 (EN-FR)

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

Standard Details

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 61967-6:2002 (EN-FR)
Document Year: 2002
Pages: 51
Edition: 1.0
  • ICS:
  • 31.200 Integrated circuits. Microelectronics

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IEC 61967-6:2002 (EN-FR)
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