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IEEE 300:1988

IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

Standard Details

This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE 300:1988
Document Year: 1988
Pages: 125
  • ICS:
  • 17.240 Radiation measurements

Life Cycle

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ACTIVE
IEEE 300:1988
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