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IEEE 1620:2008

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

Standard Details

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE 1620:2008
Document Year: 2008
Pages: 26

Life Cycle

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IEEE 1620:2008
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