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IEEE 1838:2019

IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits

Standard Details

Scope

IEEE Std 1838(TM)-2019 standardizes mandatory and optional on-chip hardware components for 3D test access. It is intended that in the future a standard is developed for a formal, computer-readable language in which implementation choices fo

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE 1838:2019
Document Year: 2019
Pages: 73

Life Cycle

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ACTIVE
IEEE 1838:2019
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