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IEEE 1445:2016

IEEE Standard for Digital Test Interchange Format (DTIF)

Standard Details

Revision Standard - Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE 1445:2016
Document Year: 2016
Pages: 64

Life Cycle

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IEEE 1445:2016
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